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Three-dimensional models allow height measurements
A 3-dimensional model can be generated without sample tilting and alignment, using 4-segment backscattered electron detector.
|Import function||Automatic select and read function of four-elements image data|
|Measurement performance||Depth accuracy less than ±20% (reference)Measurement performance varies depending on calibration accuracy, the condition of the type of specimen, the observation mode and the observation condition|
|Detectable angle range ±60° (reference)
TM4000 ±50° (reference)
|Measurement function||Section profile display extracted between any points on the three-dimensional image|
|Distance of X and Y, length and angle measurements between two points, Surface area and Volume|
|Distance of X,Y and Z, length and many other measurements between 2 points specified on section profile|
|Simple profile roughness and surface roughness measurement|
|Baseline offset (straight, curve), leveling and multiple offset|
|Cutting surface, Color contour line, Bird's-eye view and pseudo color display|
|Layout, Template and image composition from multiple images functions|
|Three-dimensional display function||Rotation, zoom-in and multiple rendering processAnimation record function of observation screen|
|Output function||Report, Image: RDF, RTF, PNG, JPG, GIF, TIF, BMP, EMF
Three-dimension image/movie: SUR, 3MF, STL, WRL, TXT, X3D/WMV, AVI
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.
Photo collections of beauty of metals, minerals, organisms etc. reproduced by the electron microscope and finished more beautifully by computer graphic technology.